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Advances in the use of X-ray computed tomography in crop phenotyping

Code: 9781801465274
Stefan Gerth, Norman Uhlmann and Michael Salamon, Fraunhofer EZRT, Germany

Chapter synopsis: This chapter addresses the technological parts of a CT system used for crop phenotyping. First, all of the hardware components are described and explained. Thus, it is shown how they are utilized for phenotyping purposes. After that, different system setups and ways of acquiring a CT dataset are shown. Additionally, the post processing of the generated data using specialized algorithms for segmentation is discussed. For above- and belowground phenotyping applications two different examples are shown to present the utilization of CT for crop phenotyping. With this chapter, the reader will be proficient in choosing a CT system for their individual phenotypic application and will know how future advances might affect the throughput or the resolution of the current systems.

DOI: 10.19103/AS.2022.0102.06
Table of contents 1 Introduction 2 X-ray sources 3 Interaction of X-rays with material 4 Detector 5 Computed tomography systems for crop phenotyping 6 From sensor to data 7 Case studies: Phenotyping using computed tomography 8 Summary and future trends 9 Where to look for further information 10 References

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